SangBum Kim, Byoungil Lee, Mehdi Asheghi, G.A.M. Hurkx, John Reifenberg, Kenneth Goodson, and H.-S. Philip Wong, "Thermal Disturbance and its Impact on Reliability of Phase-Change Memory Studied by Micro-thermal Stage," accepted for presentation to IEEE International Reliability Physics Symposium (IRPS), Anaheim, CA, May 2-6, 2010.

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