Sverdrup, P. G., Banerjee, K., Dai, C., Shih, W.K., Dutton, R. W., and Goodson, K. E., 2000, "Sub-Continuum Thermal Simulations of Deep Sub-Micron Devices Under ESD Conditions," International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), pp. 54-57.