Im, S., Banerjee, K., and Goodson, K.E., 2002, "Modeling and Analysis of Via Hot Spots and Implications for ULSI Interconnect Reliability," 40th IEEE Annual International Reliability Physics Symposium (IRPS), Dallas, TX, April 8-11, 2002.
Modeling and Analysis of Via Hot Spots and Implications for ULSI Interconnect Reliability
Im, S., Banerjee, K., and Goodson, K.E., 2002, "Modeling and Analysis of Via Hot Spots and Implications for ULSI Interconnect Reliability," 40th IEEE Annual International Reliability Physics Symposium (IRPS), Dallas, TX, April 8-11, 2002.