K. Banerjee, D-Y Kim, A. Amerasekera, C. Hu, S. Wong, and K. E. Goodson, 2000, "Microanalysis of VLSI Interconnect Failure Modes under Short-Pulse Stress Conditions," Proceedings of the 38th Annual IEEE International Reliability Physics Symposium, April 10-13, San Jose, CA, pp. 283-288.