Yalon, E., Smithe, K.K.H., Aslan, O.B., McClellan, C.J., Xiong, F., Shin, Y.C., Sood, A., Suryavanshi, S.V., Xu, R., Neumann, C., Goodson, K.E., Heinz, T., Pop, E., “Characterization of the Thermal Boundary Conductance between MoS2 and SiO2 via In-Situ Raman Spectroscopy of FunctioningTransistors”, Materials Research Society (MRS) Spring Meeting, April 2017, Phoenix, AZ