Elah Bozorg-Grayeli

ebozorgg@stanford.edu

Elah Bozorg-Grayeli received his B.S. with honors in Mechanical Engineering from the California Institute of Technology (2008), and his M.S in Mechanical Engineering from Stanford University (2010). He is currently pursuing his Ph.D. in Mechanical and Electrical Engineering. His research interests involve understanding nanoscale heat conduction in thin films and in junctions between dissimilar materials. Elah's work includes measuring thermal properties of materials used in phase change memory, high electron mobility transistors, and extreme UV mirrors, using nanosecond and picosecond thermoreflectance. He has received support from the National Defense Science and Engineering Graduate Fellowship and honorary fellowships from Stanford University and the National Science Foundation.

Related Projects

A variety of modern high-power electronic devices are based on high electron mobility transistors (HEMT) and generate enormous heat fluxes that can exceed 1 kW/cm2. The overall power conversion...
Phase change memory (PCM or PCRAM) is based on rapid, thermally-induced phase transitions in Ge2Sb2Te5 (GST) and related compounds. Because the phase change is induced by temperature changes, thermal...
Modern lithography equipment using extreme ultraviolet radiation demands precision optical components that can tolerate enormous radiation densities while resisting thermal damage. Many of these...